JPS6321999B2 - - Google Patents

Info

Publication number
JPS6321999B2
JPS6321999B2 JP56049757A JP4975781A JPS6321999B2 JP S6321999 B2 JPS6321999 B2 JP S6321999B2 JP 56049757 A JP56049757 A JP 56049757A JP 4975781 A JP4975781 A JP 4975781A JP S6321999 B2 JPS6321999 B2 JP S6321999B2
Authority
JP
Japan
Prior art keywords
memory
line
bits
bit
defective bits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56049757A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57164500A (en
Inventor
Yasuo Eguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP56049757A priority Critical patent/JPS57164500A/ja
Publication of JPS57164500A publication Critical patent/JPS57164500A/ja
Publication of JPS6321999B2 publication Critical patent/JPS6321999B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP56049757A 1981-04-02 1981-04-02 Testing device of semiconductor memory Granted JPS57164500A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56049757A JPS57164500A (en) 1981-04-02 1981-04-02 Testing device of semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56049757A JPS57164500A (en) 1981-04-02 1981-04-02 Testing device of semiconductor memory

Publications (2)

Publication Number Publication Date
JPS57164500A JPS57164500A (en) 1982-10-09
JPS6321999B2 true JPS6321999B2 (en]) 1988-05-10

Family

ID=12840054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56049757A Granted JPS57164500A (en) 1981-04-02 1981-04-02 Testing device of semiconductor memory

Country Status (1)

Country Link
JP (1) JPS57164500A (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0498093U (en]) * 1991-01-17 1992-08-25

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5066124A (en]) * 1973-10-12 1975-06-04
JPS5816559B2 (ja) * 1976-10-27 1983-03-31 日本電気株式会社 半導体記憶装置の検査装置および検査方法
JPS5384634A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Ic memory unit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0498093U (en]) * 1991-01-17 1992-08-25

Also Published As

Publication number Publication date
JPS57164500A (en) 1982-10-09

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